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Title: Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities.
Authors: Freitas, Antonio Evangelista de
Manhabosco, Taíse Matte
Batista, Ronaldo Junio Campos
Rêgo Segundo, Alan Kardek
Araujo, Humberto Xavier de
Araujo, Fernando Gabriel da Silva
Costa, Adilson Rodrigues da
Keywords: Permittivity
Solid state sintering
Issue Date: 2020
Citation: FREITAS, A. E. de et al. Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. Materials, v. 13, n. 2, p. 386, 2020. Disponível em: <>. Acesso em: 10 mar. 2020.
Abstract: Titanium dioxide substrates have been synthesized by means of solid-state reactions with sintering temperatures varying from 1150 ◦C up to 1350 ◦C. X-ray diffraction and scanning electron microscopy (SEM) where employed to investigate the crystal structure, grain size and porosity of the resulting samples. The obtained ceramics are tetragonal (rutile phase) with average grain sizes varying from 2.94 µm up to 5.81 µm. The average grain size of samples increases with increasing temperature, while the porosity decreases. The effect of microstructure on the dielectric properties has been also studied. The reduction of porosity of samples significantly improves the dielectric parameters (relative dielectric permittivity and loss tangent) in comparison to those of commercial substrates, indicating that the obtained ceramic substrates could be useful in the miniaturization of telecommunication devices.
ISSN: 1996-1944
metadata.dc.rights.license: This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license ( Fonte: o próprio artigo.
Appears in Collections:DEMET - Artigos publicados em periódicos

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